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2022-05-24T18:56:26Z

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[[Category:SOP]]
The following is an SOP for the Philips XL 40 ESEM.

== Loss Prevention ==
* Specimens must be secured onto a mount.
* A specimen must not be larger than 4 inches tall.
* Do not work at z-positions less than 10 mm.
* Do not load multiple specimens having differences in height greater than 5 mm.
* Always use rubber gloves to handle specimens and specimen holders.

== Procedure ==
# If any sample is non conductive then it will first need to be carbon coated or Pt/Pd coated.
# Secure sample onto a mount, then place the mount in a pin hole located within the ESEM chamber.
# Turn Chamber Camera on.
# Crack open the main valve of the Nitrogen (N<sub>2</sub>) cylinder.
# Close chamber door and hold shut.
# In the Vaccum window, click the vent button while holding the chamber door shut.
# Expand the BEAM dialog and click the SET GUN button. Make sure the Autobias and Autosaturation are unchecked and the gun bias position is 1.
# In the Detectors tab, select SE.
# Adjust brightness and contrast knobs until features are visible.
# Reduce magnification to a minimum and find your sample by click and dragging the mouse cursor on the screen.
# Once sample is found increase magnification and adjust focus. Use fine focus for magnifications past 1000x, use coarse focus for magnitudes equal to and less than 1000x.
# Check the working distance (WD) in the data bar on the bottom dialog box and see if it matches the z-position in the stage dialog box. If these do not match then retrain the Z-position.
# Optimize an image by adjusting the magnification, brightness and contrast.
# When ready to capture an image, open the Aztec software, or any other compatible image capturing software.
# Open "Point & ID" from the Techniques tab.
# Click New Specimen.
# Click on Scan Image Tab.
# Click start to acquire an image.

Environmental Scanning Electron Microscope - Revision history

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